Montana Tech Near-Field Scanning Optical Microscope Successfully Demonstrated


Montana Tech's Near-Field Scanning Optical Microscope (NSOM) was successfully demonstrated by Dr. Jack L. Skinner, Assistant Professor at Montana Tech. This tool is capable of dual NSOM probing, along with conductive atomic force microscopy and confocal microscopy. Recent demonstrations include an impressive topological noise of less than 0.8 Angstroms on a single layer of graphene, simultaneous topological and conductive measurements with three-dimensional graphical reconstruction of gold micro-wires, and simultaneous topological and optical field measurements with three-dimensional reconstruction of a cleaved optical fiber. Montana Tech's NSOM is an important addition to the recently approved Materials Science Ph.D. program, namely in the area of nanotechnology.