E.M. Tech - Electron Microscopy Laboratory at Montana Tech

Outreach and educational goals

• Exposure to and use of the electron microscope will help inspire an interest in science, technology, engineering, and mathematics (STEM) careers by K-12 students and teachers served by the Clark Fork Watershed Education Program (CFWEP) and the Montana Bureau of Mines and Geology.
• The ability to capture and convey the beauty of the biological, mineral and nano-scale worlds to K-12 students will spark interest in scientific careers, increase science literacy, and has the potential to combat scientific misinformation.
• The E.M.Tech facility was established to significantly benefit state-wide outreach activities and underrepresented groups in Montana, including students from rural, economically disadvantaged areas, and Native American communities.
• The microscope’s images will engage students by visualizing and scientifically characterizing viruses, minerals, nanomaterials, as well as the results of environmental damage and restoration.
• Exposure to these electron microscopy capabilities will increase student recruitment and retention, increase entry to STEM careers, and strengthen science and technology in Montana.

Users

• Faculty and Researchers at Montana Tech and in the Montana University System
• Undergraduate and Graduate Student researchers at Montana Tech, including
• PhD students in Material Science and Earth Science Engineering at Montana Tech
• K-12 educators and students via Clark Fork Watershed Education Program (CFWEP)
• Montana Bureau of Mines and Geology
• Montana Tech Laboratory Courses
• Plans for commercial use are in development

E.M. Tech Hitachi 7820

In May of 2023, courtesy of funding from the National ScienceFoundation (Award Number 2216488), the Montana Tech Department of Biological Sciences acquired a state-of-the-art Hitachi HT7820 scanning/transmission electron microscope. This 120 kV TEM has a “Dual Mode” compound objective lens system that can operate in either high contrast or high resolution (HC/HR) mode for standard TEM imaging. The HT7820 includes a Scanning Transmission Electron Microscope unit with both a brightfield and a darkfield detectors. While TEM uses a broad, parallel electron beam to obtain an image of a sample the scanning TEM uses a focused beam to scan the sample line by line. This scanning technique provides an ultra-high-resolution image of a sample in either brightfield or darkfield view. Additionally, the HT7820 will be equipped with an Oxford AZtecEnergy Energy Dispersive X-ray Spectroscopy (EDS) Microanalysis system. The EDS will allow elemental identification, localization, and mapping of elements of interest in a sample.

E.M.Tech is managed by Dr. Jim Driver, an electron microscopist with over 15 years of experience in a variety of techniques for both scanning and transmission electron microscopy. Dr. Driver will be available for consultation on sample collection and preparation for standard TEM imaging, scanning TEM, EDS, and analysis using the Hitachi HT7820. Facility users will provide samples and reagents to capture images with user training and instrument support by Dr. Driver.

Plans for commercial use are in development. Interested commercial usersplease provide input as to your anticipated needs within the Microscope Anticipated Commercial Use Form.